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RIS citation export for FRCDE3: Radiation Effects in Microelectronics - Why We Need Particle Accelerators

AU  - Pellish, J.A.
ED  - Biedron, Sandra
ED  - Simakov, Evgenya
ED  - Milton, Stephen
ED  - Anisimov, Petr M.
ED  - Schaa, Volker R.W.
TI  - Radiation Effects in Microelectronics - Why We Need Particle Accelerators
J2  - Proc. of NAPAC2022, Albuquerque, NM, USA, 07-12 August 2022
CY  - Albuquerque, NM, USA
T2  - International Particle Accelerator Conference
T3  - 5
LA  - english
AB  - We have seen anomalies due to radiation effects in electronic devices since the mid-1970s. We group radiation effects into different categories: one of which is single-event effects (SEE). SEE are any measurable or observable change in state or performance of a microelectronic device, component, subsystem, or system resulting from a single energetic-particle strike. Today, SEE dominate radiation risks for many ground- and space-based systems. Engineers require knowledge of SEE susceptibility for devices and systems since it impacts both availability and reliability. Design teams frequently use particle accelerators to simulate ionizing radiation environments. The rapid growth of systems operating in harsh radiation environments has pushed accelerator facility access constraints to the breaking point. Investments in new radiation effects testing infrastructure have begun. Meanwhile, there remain unanswered questions about accelerator facility workforce and potential business model impacts on existing ecosystems. We must maintain existing facility access as while building out new capabilities, or risk unacceptable impacts to product development and space system operations.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
ER  -