Author: Arias, T.
Paper Title Page
TUPA86 Simulations of Nanoblade Cathode Emissions with Image Charge Trapping for Yield and Brightness Analyses 535
  • J.I. Mann, G.E. Lawler, J.B. Rosenzweig, B. Wang
    UCLA, Los Angeles, California, USA
  • T. Arias, J.K. Nangoi
    Cornell University, Ithaca, New York, USA
  • S.S. Karkare
    Arizona State University, Tempe, USA
  Funding: National Science Foundation Grant No. PHY-1549132
Laser-induced field emission from nanostructures as a means to create high brightness electron beams has been a continually growing topic of study. Experiments using nanoblade emitters have achieved peak fields upwards of 40 GV/m according to semi-classical analyses, begging further theoretical investigation. A recent paper has provided analytical reductions of the common semi-infinite Jellium system for pulsed incident lasers. We utilize these results to further understand the physics underlying electron rescattering-type emissions. We numerically evaluate this analytical solution to efficiently produce spectra and yield curves. The effect of space-charge trapping at emission may be simply included by directly modifying these spectra. Additionally, we use a self-consistent 1-D time-dependent Schrödinger equation with an image charge potential to study the same system as a more exact, but computationally costly, approach. With these results we may finally investigate the mean transverse energy and beam brightness at the cathode in these extreme regimes.
DOI • reference for this paper ※ doi:10.18429/JACoW-NAPAC2022-TUPA86  
About • Received ※ 02 August 2022 — Revised ※ 08 August 2022 — Accepted ※ 10 August 2022 — Issue date ※ 03 September 2022
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