Author: Wan, W.
Paper Title Page
Current Status of Developing an Ultrafast Electron Microscope  
  • X. Yang, T.V. Shaftan, V.V. Smaluk, Y. Zhu
    BNL, Upton, New York, USA
  • P. Musumeci
    UCLA, Los Angeles, California, USA
  • W. Wan
    ShanghaiTech University, Shanghai, People’s Republic of China
  Recent studies of ultrafast electron microscopy (UEM) techniques show the use of short bunches of relativistic electrons are promising for the development of a new instrument for imaging samples of various materials. Compared to conventional electron microscopes, the main advantage of UEMs with the electron energy of a few MeV is the possibility to study thick samples. We will discuss the progress of UEM design to date, the principal challenges on the way to a high resolution, and possible methods for their mitigation including the design of low-aberration magnetic optics, RF and mechanical subsystems with high stability, and precise collimation of electrons scattered in the samples.  
slides icon Slides WEZE1 [11.286 MB]  
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