ANL, Lemont, Illinois, USA
Ion trapping occurs when a negatively charged beam ionizes residual gas inside an accelerator vacuum chamber, and the resulting ions become trapped in the beam potential. Trapped ions can cause a variety of undesirable effects, including coherent instability and incoherent emittance growth. Because of the challenging emittance and stability requirements of next generation light sources, ion trapping is a serious concern. To study this effect at the present APS, a gas injection system was designed and installed at two different locations in the ring. The system creates a controlled and localized pressure bump of nitrogen gas, so the resulting ion instability can be studied. Measurements were taken under a wide variety of beam conditions, using a spectrum analyzer, pinhole camera, and bunch-by-bunch feedback system. The feedback system was also used to perform grow-damp measurements, allowing us to measure the growth rate of individual unstable modes. This paper will present some of the results of these experiments. Simulations using the IONEFFECTS element in the particle tracking code elegant will also be presented.
