JLab, Newport News, Virginia, USA
ECFM-UAS, Culiacan, Sinaloa, Mexico
ODU, Norfolk, Virginia, USA
Polarized electrons from GaAs photocathodes have been key to some of the highest-impact results of the Jefferson Lab science program over the past 30 years. During this time, various studies have given insight into improving the operational lifetime of these photocathodes in DC high-voltage photo-guns while using lasers with spatial Gaussian profiles of typically 0.5 mm to 1 mm FWHM, cathode voltages of 100 kV to 130 kV, and a wide range of beam currents up to multiple mA. In this contribution, we show recent experimental data from a 100 kV to 180 kV setup and describe our progress at predicting the lifetime based on the calculable dynamics of ionized gas molecules inside the gun. These new experimental studies at Jefferson Lab are specifically aimed at exploring the ion damage of higher-voltage guns being built for injectors.
ODU, Norfolk, Virginia, USA
JLab, Newport News, Virginia, USA
In this work, we investigated the evolution in bunch length of beams through the CEBAF injector for low to high charge per bunch. Using the General Particle Tracer (GPT), we have simulated the beams through the beamline of the CEBAF injector and analyzed the beam to get the bunch lengths at the location of chopper. We performed these simulations with the existing injector using a 130 kV gun voltage. Finally, we describe measurements to validate these simulations. The measurements have been done using chopper scanning technique for two injector laser drive frequency modes: one with 500 MHz, and another with 250 MHz.
