Author: Zhu, Y.
Paper Title Page
WEZE1
 Current Status of Developing an Ultrafast Electron Microscope  
 
  • X. Yang, T.V. Shaftan, V.V. Smaluk, Y. Zhu
    BNL, Upton, New York, USA
  • P. Musumeci
    UCLA, Los Angeles, California, USA
  • W. Wan
    ShanghaiTech University, Shanghai, People’s Republic of China
  
  Re­cent stud­ies of ul­tra­fast elec­tron mi­croscopy (UEM) tech­niques show the use of short bunches of rel­a­tivis­tic elec­trons are promis­ing for the de­vel­op­ment of a new in­stru­ment for imag­ing sam­ples of var­i­ous ma­te­ri­als. Com­pared to con­ven­tional elec­tron mi­cro­scopes, the main ad­van­tage of UEMs with the elec­tron en­ergy of a few MeV is the pos­si­bil­ity to study thick sam­ples. We will dis­cuss the progress of UEM de­sign to date, the prin­ci­pal chal­lenges on the way to a high res­o­lu­tion, and pos­si­ble meth­ods for their mit­i­ga­tion in­clud­ing the de­sign of low-aber­ra­tion mag­netic op­tics, RF and me­chan­i­cal sub­sys­tems with high sta­bil­ity, and pre­cise col­li­ma­tion of elec­trons scat­tered in the sam­ples.  
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